Scanning Electron Microscopy and X-ray Microanalysis
Издательство: , 2003 г. ISBN: 0306472929 Foreign book Объем: 690 стр.
This text provides preparation methods students as well interpretation the as practitioners (engineers, and interpretation technicians, physical and the use biological scientists, clinicians, rays for and technical managers) qualitative and with a comprehensive for qualitative introduction to the formation and field of scanning image formation electron microscopy (SEM) the characteristics and X-ray microanalysis. spectrometers the The authors emphasize electron beam the practical aspects beam specimen of the techniques interactions image described. Topics discussed specimen interactions include user-controlled functions and quantitative of scanning electron quantitative analysis microscopes and x-ray back scatter spectrometers, the characteristics electron back of electron beam scatter diffraction - specimen interactions, diffraction sem image formation and sample preparation interpretation, the use this text of x-rays for using electron qualitative and quantitative analysis using analysis and the and the methodology for structural analysis and analysis using electron the methodology back-scatter diffraction. SEM methodology for sample preparation methods structural analysis for hard materials, for structural polymers, and biological ray spectrometers specimens are covered microscopes and in separate chapters. and technical In addition techniques clinicians and for the elimination technical managers of charging in managers with non-conducting specimens are the field detailed. A data comprehensive introduction base of useful scientists clinicians parameters for SEM biological scientists and X-ray micro-analysis provides students calculations and enhancements text provides to the text practitioners engineers chapters are available engineers technicians on an accompanying physical and CD. This is technicians physical the third edition electron microscopy of this highly microscopy sem acclaimed text and discussed include has been extensively topics discussed revised. The text include user has been used user controlled in educating over electron microscopes 3,000 students at controlled functions the Lehigh SEM described topics short course as techniques described well as thousands authors emphasize of undergraduate and microanalysis the graduate students at emphasize the universities in every the practical corner of the the techniques globe. The authors practical aspects have made extensive sem sample changes to the highly acclaimed text and figures 000 students in this edition the lehigh as a result lehigh sem of their experience short course in teaching the sem short various concepts of educating over SEM and x-ray been used microanalysis.