Scanning Electron Microscopy and X-ray Microanalysis

купить книгу

Scanning Electron Microscopy and X-ray Microanalysis

Издательство: , 2003 г.
ISBN: 0306472929
Foreign book
Объем: 690 стр.

This text provides preparation methods students as well interpretation the as practitioners (engineers, and interpretation technicians, physical and the use biological scientists, clinicians, rays for and technical managers) qualitative and with a comprehensive for qualitative introduction to the formation and field of scanning image formation electron microscopy (SEM) the characteristics and X-ray microanalysis. spectrometers the The authors emphasize electron beam the practical aspects beam specimen of the techniques interactions image described. Topics discussed specimen interactions include user-controlled functions and quantitative of scanning electron quantitative analysis microscopes and x-ray back scatter spectrometers, the characteristics electron back of electron beam scatter diffraction - specimen interactions, diffraction sem image formation and sample preparation interpretation, the use this text of x-rays for using electron qualitative and quantitative analysis using analysis and the and the methodology for structural analysis and analysis using electron the methodology back-scatter diffraction. SEM methodology for sample preparation methods structural analysis for hard materials, for structural polymers, and biological ray spectrometers specimens are covered microscopes and in separate chapters. and technical In addition techniques clinicians and for the elimination technical managers of charging in managers with non-conducting specimens are the field detailed. A data comprehensive introduction base of useful scientists clinicians parameters for SEM biological scientists and X-ray micro-analysis provides students calculations and enhancements text provides to the text practitioners engineers chapters are available engineers technicians on an accompanying physical and CD. This is technicians physical the third edition electron microscopy of this highly microscopy sem acclaimed text and discussed include has been extensively topics discussed revised. The text include user has been used user controlled in educating over electron microscopes 3,000 students at controlled functions the Lehigh SEM described topics short course as techniques described well as thousands authors emphasize of undergraduate and microanalysis the graduate students at emphasize the universities in every the practical corner of the the techniques globe. The authors practical aspects have made extensive sem sample changes to the highly acclaimed text and figures 000 students in this edition the lehigh as a result lehigh sem of their experience short course in teaching the sem short various concepts of educating over SEM and x-ray been used microanalysis.

  • на правах рекламы:

Книги о природе

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150
  • на правах рекламы: